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DESCRIPTION: In this Advanced Training Module\, participants will learn the
  basics of thin film deposition and characterization. Working in pairs\, st
 udents will rotate through five different experimental stations where they 
 will grow their own thin films and practice characterizing them. Films will
  be deposited using two techniques: sputter deposition and thermal evaporat
 ion. Measurement of surface topology will be made through atomic force micr
 oscopy (AFM)\, chemical composition will be characterized through energy di
 spersive x-ray spectroscopy (EDXS) and finally magnetic hysteresis loops wi
 ll be measured through magneto-optical Kerr effect (MOKE). Participants wil
 l have the chance to suggest their own desired multilayers for deposition o
 r bring their own samples for characterization or\, alternatively\, will co
 mplete a self-contained mini-project through the course of the training mod
 ule. The practical sessions will be supported by a lecture exploring the ph
 ysics of thin-film growth. 
DTEND:20240124T120000
DTSTAMP:20231122T112800
DTSTART:20240122T120000
CLASS:PUBLIC
LOCATION:MLU Halle-Wittenberg - Institute of physics
SEQUENCE:0
SUMMARY:iRTG - Advanced Training Module (Basics of thin-film deposition and
  characterization)
UID:135692265@/www.trr227.de
URL:https://www.trr227.de/dates/atm-taylor.html
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