In this one-day course the participants will be introduced to the fundamentals of scanning tunnelling microscopy (STM) and gain experience in sample characterization under ultra-high vacuum conditions and at ultra-low temperatures. The ideas behind advanced techniques, such as the coupling of light into the tunneling junction or measurements in a magnetic field, will be explained as well.
Time & Location
Dec 06, 2023 | 10:00 AM - 06:00 PM
AG Prof. Katharina Franke - FU Berlin - Department of physics